FEATURES OF THE INTERACTION OF POLARIZED RADIATION WITH A FLAT DIELECTRIC SURFACE

Abstract

The work examines the critical angles of incidence of polarized light on a flat dielectric surface of the medium, at which the identity of the polarization states of the incident and reflected optical radiation is observed. It is shown that such critical angles of incidence (critical polarization angles of incidence) provide conditions for the same phase delays of S and P components in incident and reflected light.